PST MBH & CO. KG | TU BERGAKADEMIE FREIBERG

Evaluation of extensive series of diffractograms with the aid of factor analysis

The use of statistical factor analysis for evaluating X-ray diffraction data is illustrated using two examples. These show that it is possible to calibrate complete diffractograms instead of individual peaks for quantitative analysis. Processes that cause systematic changes in the samples can be identified and described with the aid of virtually continuous measurements.

1 Introduction

This article uses two examples to show possible applications of statistical factor analysis for evaluating X-ray diffraction data (Figure 1). X-ray diffraction analysis is a valuable tool in both the production and development of building materials. Modern evalu-ation methods, such as the Rietveld method, permit very precise phase analysis and make it possible to draw conclusions about raw materials and methods of production and processing.

Conventional evaluation methods start from diffractograms that were measured under favourable conditions for which, for example, a narrow...

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